IC DESIGN VERIFICATION: Verify design changes before and after you spin a new mask.  Make modifications in a fraction of the time it takes to get new material out of the FAB.

DEBUG: Need to probe a burried net or a metal line smaller than your probe tip?  FIB-X can enable your debug requirements by installing FIB probe pads.

CROSS SECTIONS: Looking for voids in your VIA or process defects?  Our 5nm ion column will give you clean and precise cross sections allowing you to verify process anomalies.

CUSTOMER SAMPLES:  Once you have verified a fix, we can produce samples that are encapsulated for safe handling by your customers.  We can also handle up to an 8 inch wafer enabling us to increase efficency while modifying many die.

X-SERVICES:  If you can conceive it we'll try it.  Don't be afraid to ask.