With ever shrinking technology nodes and ever increasing number of metal layers, you have scratched your head time and again wondering how you are going to probe that one node buried under a power plane or that one node only available at metal 1.  We can help.  FIB-X's FIB team can reach most nodes using high aspect ratio milling capability allowing the creation of probe structures.  If you are in the digital world and need to create a timing delay element or if you are in need of tweaking an analog circuit, we can create resistors with an accuracy of +/- 10% in most cases.  We are aware of analog circuit sensitivities to FIB and will take the necessary steps to ensure that your device parameters will be minimally impacted by the FIB experiment.

Example of an IC modification with a probe pad for verification.